The model short Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. The probe is made of stainless steel with a Delrin® handle. Meets IEC 60950 and 61032, as well as other national and international standards. All ED&D probes come with NIST traceable certificates of calibration. There is an additional fee for the data, and it must be ordered in advance. ED&D utilizes ISO/IEC 17025 quality systems, and operates a full calibration lab. IEC61032-Probe 13-Figure 9
Meets Requirements for Testing Standard(s) including but not limited to:IEC 60601 IEC 61010 IEC 60950 IEC 61032
Test probe diameter 3mm
Test probe length 15mm
Baffle plate thickness 4mm
Baffle plate diameter 25mm
Handle length 20mm
Handle diameter 10mm
Meets Requirements for Testing Standard(s) including but not limited to:IEC 60601 IEC 61010 IEC 60950 IEC 61032
Test probe diameter 3mm
Test probe length 15mm
Baffle plate thickness 4mm
Baffle plate diameter 25mm
Handle length 20mm
Handle diameter 10mm